What is the basis for the new method of calculating Substrate Correction Values?

The basis for the new method of calculating Substrate Correction Values relies on taking the average of three shots on bare substrate. This approach ensures that the readings are not influenced by surface contamination, variations in material composition, or imperfections in the substrate itself. By averaging multiple measurements, it helps to minimize the random error that might occur from any single reading. This level of accuracy is essential for deriving reliable correction values that can be applied in various lead inspection scenarios.

Other methods might involve different techniques, like assessing readings on various substrates or relying on comparison against standardized materials, but they do not provide the detailed averaging approach that helps refine the correction values as effectively as the average of multiple shots does. This method stands out for its empirical rigor in establishing a clear and accurate baseline measurement for assessing lead levels in diverse environments where different substrates might influence the readings.